Pharmacology & Toxicology Graduate Students
Sachin Kandlikar, Graduate Student

   Contact Info:kandlika@msu.edu

Biography:

I pursued a bachelor’s degree in medicine and surgery (M.B.B.S.) from India before coming to the US in 2002. I received a master’s degree in biology at Oakland University, Rochester, MI. My thesis research focused on cloning and expression of anti-vesicular stomatitis virus single chain fragment variables for a capacitance biosensor. I am currently doing a rotation in Dr. Fink’s lab.

Selected Awards:

SEBM's Young Investigator Award at Experimental Biology 2008
ASPET Graduate Student Travel Award at Experimental Biology 2008

Selected Publications/Abstracts:

Darrin M. Hanna, Brooks A. Gross, Sachin Kandlikar, Elizabeth Lempicki, Barbara A. Oakley, and Gabrielle A. Stryker. “Detection of Vesicular Stomatitis Virus using a Capacitive Immunosensor," Proceedings of the IEEE-EMBS 2005 Conference, September 1-4, 2005, Shanghai, China.

Barbara Oakley, Darrin Hanna, Sachin Kandlikar, Brooks Gross, Gabrielle Stryker. “Cell Lysis in SWLA-2 Hybridomas due to 1 kHz AC Electric Fields,” Proceedings of the IEEE-EMBS 2005 Conference, September 1-4, 2005, Shanghai, China.

Clark, AK., Kovtunovych, G., Kandlikar, SS., Lal, SK., and Stryker, GA. Cloning and expression analysis of two novel paraflagellar rod domain genes found in Trypanosoma cruzi. Parasitol Res (2005) 96: 312–320

Kandlikar, SS., Oakley, BA., Hanna, DM., Stryker, GA. 2004. "An Examination of the Effect of Decaying Exponential Pulse Electric Fields on Cell Mortality in Murine Spleenocytes, Hybridomas, and Human Natural Killer Cells," Engineering in Medicine and Biology Society. Proceedings of the 26th Annual International Conference of the IEEE 26:2643-2646.

Gross, BA., Kandlikar, SS., Oakley, BA., Hanna, DM., Rusek, A., Stryker, GA. 2004. "An Examination of the Effect of an AC Pulsed Electric Field on Cell Mortality in SWLA-2 Hybridomas," Engineering in Medicine and Biology Society. Proceedings of the 26th Annual International Conference of the IEEE 26:2635-2638.